Patent · US Expired

Method and apparatus for controlling bonding load of fine lead electrode

US5615822A · kind A · utility

0Cited by
2References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 22, 1995
Grant dateApr 1, 1997
Priority date
Expiry dateSep 22, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/12042
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In this invention, a designed value of a lead width is previously input and a bonding load suitable for the designed lead width is previously input before the step of continuously bonding a TAB tape on a semiconductor chip is effected. Next, the TAB tape and chip are carried to preset positions, and after recognition of the positions of the tape and chip and the alignment of the tape and chip by use of a CCD camera are completed, the inner lead width is actually measured by use of the CCD camera. The measured lead width is compared with the designed lead width, and when a difference therebetween exceeds a preset reference value, the bonding load is changed to a bonding load suitable for the measured lead width of the lead to be actually bonded based on the ratio of the measured lead width to the designed lead width and then the bonding operation is effected by the suitable bonding load.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.