Method of testing a random access memory
US5619460A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 7, 1995 |
| Grant date | Apr 8, 1997 |
| Priority date | — |
| Expiry date | Jun 7, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of testing a RAM. The RAM array is arranged in rows and columns. The rows are grouped into word line groups. The method includes the steps of: a) asserting an array select signal; b) selecting a group of rows in the array; c) selecting at least one row of the selected group of rows; and, d) repeating steps b and c until all of the groups are selected. Array Sense Amps may be set when the first group is selected and remain set until the last group is selected. In one test, word lines in all of the selected rows are activated and remain activated until the final selected row is selected. In a second test, word lines in selected groups are toggled with RAS. If a group contains a known defective word line, that group is either not addressed or its selection is disabled. In each selected group, one row, alternating rows or, all of the rows may be selected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.