Patent · US Expired

Low cost method of fabricating shallow junction, Schottky semiconductor devices

US5635414A · kind A · utility

0Cited by
17References
19Claims
0Family size

Inventors

Key dates

Filing dateMar 28, 1995
Grant dateJun 3, 1997
Priority date
Expiry dateMar 28, 2015

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/974
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Significant reduction in the cost of fabrication of shallow junction, Schottky or similar semiconductor devices without sacrifice of functional characteristics, while at the same time achieving the advantages is achieved, after the non-polishing cleaning step is essentially performed, by subjecting the substrate to conditions which move disadvantageous factors within said substrate into a space substantially at said surface, followed by substantially removing said factor-containing space from said substrate chemical removal step, followed etching and vapor deposition steps. Although these new steps add time, and therefore cost, to the overall process, the devices under discussion when produced by known industry processes require yet more time, and involve yet more expense, so that the total process represents a substantial reduction in the cost of their manufacture while producing devices which are the equivalent or superior in electrical performance to such devices which are made by known industry processes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.