Apparatus used for total reflection fluorescent X-ray analysis on a liquid drop-like sample containing very small amounts of impurities
US5636256A · kind A · utility
6Cited by
0References
10Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Aug 30, 1996 |
| Grant date | Jun 3, 1997 |
| Priority date | — |
| Expiry date | Aug 30, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus is disclosed which is used for total reflection fluorescent X-ray analysis on a liquid drop-like sample containing very small amounts of impurities. The apparatus comprises a heat-resistant thin sheet containing an element or elements, as a principal component, not detected on total reflection fluorescent X-ray analysis and an x-ray source directing an X-ray as an incident X-ray at a liquid drop-like sample put on the sheet and containing very small amounts of impurities whereby the liquid drop-like sample is evaporated to a dried solid for the total reflection fluorescent X-ray analysis to be performed there.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.