Patent · US Expired

Method for producing a Bi-MOS device

US5641692A · kind A · utility

8Cited by
14References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 18, 1995
Grant dateJun 24, 1997
Priority date
Expiry dateDec 18, 2015

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/009

Abstract

A method for producing a semiconductor device which decrease the number of processes at the time of producing BiCMOSLSI than the usual. Impurities are introduced into a semiconductor substrate under a second insulating film and a first electric conductive film utilizing a first insulating film and the first conductive film formed on the semiconductor substrate as masks. Therefore, it is able to perform concurrent introduction of impurities into the gate electrode, the source and the drain of the MOSFET, the base electrode of the bipolar transistor, the emitter and the collector contact of the lateral bipolar transistor, the outlet electrode of the capacitor, and the resistor, so that the number of process steps can be reduced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.