Patent · US Expired

Apparatus and method for depositing particles onto a wafer

US5654205A · kind A · utility

4Cited by
3References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 7, 1995
Grant dateAug 5, 1997
Priority date
Expiry dateJun 7, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L22/12
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus for depositing particles onto a wafer comprises a particle generating means; particle size controlling means connected to an output terminal of the particle generating means; a first transmitting tube connected to an output of the particle size controlling means; second and a third transmitting means connected to an output terminal of the first transmitting tube; first counting means connected to an output terminal of the second transmitting tube; particle depositing means connected to an output terminal of the third transmitting means; second counting means connected to the particle depositing means; and a power supplier connected to the particle depositing means. The apparatus and a method for depositing the particles onto the wafer provide a wafer on which particles of known size and kind are deposited. Also, the particles of a different kind and size are deposited on the same wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.