Patent · US Expired

Implantation of nucleating species for selective metallization and products thereof

US5654245A · kind A · utility

67Cited by
6References
29Claims
0Family size

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Key dates

Filing dateMar 23, 1993
Grant dateAug 5, 1997
Priority date
Expiry dateMar 23, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76879
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The invention provides a method and structure in which a nucleating species [54] is implanted through apertures [52] of a metal-phobic layer [40] into a support layer [17] and copper or a like metal is selectively grown at the implant site or sites. The implant support layer [17] is preferably composed of a material which inhibits diffusion therethrough of the copper or other like grown metal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.