Sharp Microelectronics Technology Inc.
70Patents
0Active
70Granted
39Portfolio score
Filing activity: Sep 8, 1987 → Nov 6, 1998
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5897379A | Low temperature system and method for CVD copper removal | Electricity | 361 | Expired |
| US5904565A | Low resistance contact between integrated circuit metal levels and method for same | Electricity | 216 | Expired |
| US5792679A | Method for forming silicon-germanium/Si/silicon dioxide heterostructure using germanium implant | Electricity | 196 | Expired |
| US5293645A | Apparatus and method for locating mobile and portable radio terminals in a radio network | Physics | 150 | Expired |
| US5915199A | Method for manufacturing a CMOS self-aligned strapped interconnection | Electricity | 113 | Expired |
| US5821169A | Hard mask method for transferring a multi-level photoresist pattern | Electricity | 84 | Expired |
| US5794146A | System and method for conserving battery power in a mobile station searching to select a serving cell | Emerging Cross-Sectional Technologies | 84 | Expired |
| US5671221A | Receiving method and apparatus for use in a spread-spectrum communication system | Electricity | 83 | Expired |
| US5680641A | Multiple register bank system for concurrent I/O operation in a CPU datapath | Physics | 70 | Expired |
| US5654245A | Implantation of nucleating species for selective metallization and products thereof | Electricity | 67 | Expired |
| US5468657A | Nitridation of SIMOX buried oxide | Emerging Cross-Sectional Technologies | 63 | Expired |
| US4875196A | Method of operating data buffer apparatus | Physics | 62 | Expired |
| US5436175A | Shallow SIMOX processing method using molecular ion implantation | Electricity | 61 | Expired |
| US5313413A | Apparatus and method for preventing I/O bandwidth limitations in fast fourier transform processors | Physics | 56 | Expired |
| US5753417A | Multiple exposure masking system for forming multi-level resist profiles | Physics | 55 | Expired |
| US5684404A | System and method of measuring a battery lifetime | Physics | 45 | Expired |
| US5736002A | Methods and equipment for anisotropic, patterned conversion of copper into selectively removable compounds and for removal of same | Electricity | 36 | Expired |
| US5448706A | Address generator for multi-channel circular-buffer style processing | Physics | 35 | Expired |
| US5439848A | Method for fabricating a self-aligned multi-level interconnect | Electricity | 35 | Expired |
| US5830775A | Raised silicided source/drain electrode formation with reduced substrate silicon consumption | Emerging Cross-Sectional Technologies | 35 | Expired |
| US5906910A | Multi-level photoresist profile method | Physics | 34 | Expired |
| US5726459A | GE-SI SOI MOS transistor and method of fabricating same | Electricity | 33 | Expired |
| US5712553A | Battery transposition system and method | Emerging Cross-Sectional Technologies | 33 | Expired |
| US5913144A | Oxidized diffusion barrier surface for the adherence of copper and method for same | Electricity | 32 | Expired |
| US5502674A | Method and apparatus for repair of memory by redundancy | Physics | 32 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.