Patent · US Expired

ESD protection for universal grid type test fixtures

US5663655A · kind A · utility

25Cited by
1References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 22, 1995
Grant dateSep 2, 1997
Priority date
Expiry dateSep 22, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/18
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test fixture provides ESD protection to electronic switching circuitry in a universal grid type fixture having test probes arranged for electrical contact with a printed circuit board under test and in which test signals are sent between the circuit board and a high speed electronic test analyzer through intervening switching circuits. The test fixture includes a movable probe plate, a test probe mounted in the probe plate, the test probe including a movable plunger for making electrical contact with a printed circuit board during a test cycle, the plunger being movable between a first position and a second position, and a ground plane on the movable probe plate connected to electrical ground, the probe plunger having a ground plane contact element that contacts the ground plane in said first position of the plunger and which moves out of the contact with the ground plane when the plunger moves to the second position. The probe plate, is moved to a pre-test position in which the plunger is in the first position and in an electrical contact with the circuit board so that electrostatic charges on the board are dissipated to electrical ground through the ground plane via contact bet…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.