Patent · US Expired

Method for making fully self-aligned submicron heterojunction bipolar transistor

US5665614A · kind A · utility

24Cited by
12References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 6, 1995
Grant dateSep 9, 1997
Priority date
Expiry dateJun 6, 2015

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/944

Abstract

A submicron emitter heterojunction bipolar transistor and a method for fabricating the same is disclosed. The fabrication process includes lattice matched growth of subcollector, collector, base, emitter, and emitter cap layers in sequential order on a semi-insulating semiconductor substrate. An emitter cap mesa, an emitter/base/collector mesa and a subcollector mesa are formed. Dielectric platforms are formed extending the base/collector layers laterally. Sidewalls are formed on the sides of emitter cap mesa and the sides of the extended base/collector layers and undercuts are etched into the emitter layer and the upper portion of the subcollector layer. This forms an overhang on the emitter cap mesa with respect to the emitter layer and an overhang on the base/collector layers with respect to the upper portion of the subcollector layer. Emitter, base and collector contacts are simultaneously formed, the base contact aligned to the edge of the emitter cap overhang and the collector contact aligned to the edge of the base/collector layer overhang.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.