Patent · US Expired

FET with gate spacer

US5679589A · kind A · utility

25Cited by
13References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 3, 1992
Grant dateOct 21, 1997
Priority date
Expiry dateApr 3, 2012

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/021

Abstract

A semiconductor integrated circuit structure and method of fabrication is disclosed. The structure includes a FET gate with adjacent double or triple layered gate spacers. The spacers permit precise tailoring of lightly doped drain junction profiles having deep and shallow junction portions. In addition, a self-aligned silicide may be formed solely over the deep junction portion thus producing a reliable low contact resistance connection to source and drain.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.