Surface inspection device
US5680473A · kind A · utility
11Cited by
16References
1Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Nov 27, 1995 |
| Grant date | Oct 21, 1997 |
| Priority date | — |
| Expiry date | Nov 27, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8887
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for inspecting the surface of objects such as band-like running material, which may be metal, paper, or textile, without stopping or reducing the speed of the inspection line, to determine the occurrence of defects. The inspected object surface image and defect data are recorded so that at a desirable later time, the defect data may be reviewed to make a judgement of acceptance or rejection of the object. The apparatus provides an effective control on production.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.