Patent · US Expired

Method of forming airbridged metallization for integrated circuit fabrication

US5686743A · kind A · utility

8Cited by
15References
2Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 10, 1996
Grant dateNov 11, 1997
Priority date
Expiry dateJul 10, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K3/4685
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for forming an airbridge for interconnecting metal contacts on an integrated circuit. The airbridge is formed by initially patterning a support photoresist between the metal contacts to be interconnected, over the metal contact to be crossed. The pattern support photoresist is flood exposed with UV light and subsequently baked at a relatively high temperature to cause the support photoresist to flow into a generally spherical shape. The airbridged metal lines are patterned over the spherically shaped support photoresist. Excess metallization is lifted off the support photoresist and the photoresist used to pattern the airbridge is removed, forming an airbridge with curvature along both its width and length.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.