High speed serial data pin for automatic test equipment
US5689515A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 26, 1996 |
| Grant date | Nov 18, 1997 |
| Priority date | — |
| Expiry date | Apr 26, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31922
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A tester that produces digital timing signals having fast data rates including multiple groups of timing generators, multiple "exclusive-or" gates, and an "or" gate. Each group of timing generators is connected to an exclusive-or gate, and the output of each exclusive-or gate is coupled to the or gate. The digital timing signals are encoded such that the timing generators in each group may assert timing pulses only during specified cycles within a series of clock cycles. Each combination of timing generators within a group either asserting their respective encoded timing signals, or not asserting any timing signals during the series of clock cycles, generates a unique serial data stream. The serial data streams generated by the groups of timing generators are then combined to produce a new digital timing signal having a data rate that is faster than the data rate of the encoded digital timing signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.