Michael C. Panis
12Patents
6h-index
5Co-inventors
59Inventor score
Filing activity: Nov 9, 1995 → May 10, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5689515A | High speed serial data pin for automatic test equipment | Physics | 32 | Expired |
| US5604751A | Time linearity measurement using a frequency locked, dual sequencer automatic test system | Physics | 18 | Expired |
| US5938780A | Method for capturing digital data in an automatic test system | Physics | 13 | Expired |
| US7017087B2 | Enhanced loopback testing of serial devices | Physics | 12 | Expired |
| US6981192B2 | Deskewed differential detector employing analog-to-digital converter | Physics | 7 | Expired |
| US6550036B1 | Pre-conditioner for measuring high-speed time intervals over a low-bandwidth path | Physics | 6 | Expired |
| US7668235B2 | Jitter measurement algorithm using locally in-order strobes | Physics | 3 | Active |
| US7606675B2 | Jitter frequency determining system | Physics | 2 | Active |
| US7337377B2 | Enhanced loopback testing of serial devices | Physics | 2 | Expired |
| US7349818B2 | Determining frequency components of jitter | Physics | 2 | Expired |
| US7519490B2 | Determining frequency components of jitter | Physics | 1 | Active |
| US10896106B2 | Bus synchronization system that aggregates status | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.