Patent · US Expired

Memory cell and wordline driver for embedded DRAM in ASIC process

US5694355A · kind A · utility

39Cited by
2References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 23, 1997
Grant dateDec 2, 1997
Priority date
Expiry dateJan 23, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2207/104
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A DRAM charge storage structure including of a p-channel access FET in an n.sup.- doped well of a p.sup.- doped substrate, a p.sup.- channel charge storage capacitor, conductive apparatus connecting a gate of the charge storage capacitor to a drain of the FET, and apparatus for applying a boosted word line voltage to a gate of the FET.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.