Patent · US Expired

Method for fabricating a semiconductor device using a catalyst introduction region

US5696003A · kind A · utility

155Cited by
17References
36Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 16, 1994
Grant dateDec 9, 1997
Priority date
Expiry dateDec 16, 2014

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/016
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Into an amorphous silicon film, catalyst elements for accelerating the crystallization are introduced. After patterning the amorphous silicon films in which the catalyst elements have been introduced into an island pattern, a heat treatment for the crystallization is conducted. Thus, the introduced catalyst elements efficiently diffuse only inside the island-patterned amorphous silicon films. As a result, a high-quality crystalline silicon film, having the crystal growth direction aligned in one direction and having no grain boundaries, is obtained. Using the thus formed crystalline silicon film, semiconductor devices having a high performance and stable characteristics are fabricated efficiently over the entire substrate, irrespective of the size of the devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.