Patent · US Expired

Method for making aluminum gallium arsenide semiconductor device with native oxide layer

US5696023A · kind A · utility

56Cited by
17References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 7, 1995
Grant dateDec 9, 1997
Priority date
Expiry dateJun 7, 2015

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/118
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of forming a native oxide from an aluminum-bearing Group III-V semiconductor material is provided. The method entails exposing the aluminum-bearing Group III-V semiconductor material to a water-containing environment and a temperature of at least about 375 C to convert at least a portion of said aluminum-bearing material to a native oxide characterized in that the thickness of said native oxide is substantially the same as or less than the thickness of that portion of said aluminum-bearing Group III-V semiconductor material thus converted. The native oxide thus formed has particular utility in electrical and optoelectrical devices, such as lasers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.