Patent · US Expired

Semiconductor device having an ESD protective circuitry

US5706156A · kind A · utility

14Cited by
1References
18Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 25, 1996
Grant dateJan 6, 1998
Priority date
Expiry dateJan 25, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D89/611

Abstract

A semiconductor device has a protective circuitry including a common discharge line, a first protective device connected between one of input/output terminals and the discharge line, and a second protective device connected between one of Vcc and ground terminals and the discharge line. The second protective device has an on-resistance as much as 1/2 of the on-resistance of the first protective device. Each of the power terminals and ground terminals generally has a large capacitance to accumulate a large amount of electric charge during a CDM test after charging of the semiconductor device as a whole. The low on-resistance prevents the inner circuit and input/output buffers of the semiconductor device from being applied with a higher potential during subsequent grounding of the semiconductor device in the CDM test.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.