Patent · US Expired

EEPROM with split gate source side injection

US5712180A · kind A · utility

278Cited by
43References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 28, 1996
Grant dateJan 27, 1998
Priority date
Expiry dateFeb 28, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/5634
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Novel memory cells utilize source-side injection, allowing very small programming currents. If desired, to-be-programmed cells are programmed simultaneously while not requiring an unacceptably large programming current for any given programming operation. In one embodiment, memory arrays are organized in sectors with each sector being formed of a single column or a group of columns having their control gates connected in common. In one embodiment, a high speed shift register is used in place of a row decoder to serially shift in data for the word lines, with all data for each word line of a sector being contained in the shift register on completion of its serial loading. In one embodiment, speed is improved by utilizing a parallel loaded buffer register which receives parallel data from the high speed shift register and holds that data during the write operation, allowing the shift register to receive serial loaded data during the write operation for use in a subsequent write operation. In one embodiment, a verification is performed in parallel on all to-be-programmed cells in a column and the bit line current monitored. If all of the to-be-programmed cells have been properly progr…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.