Patent · US Expired

Insulated gate type semiconductor device having built-in protection circuit

US5719420A · kind A · utility

4Cited by
0References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 25, 1996
Grant dateFeb 17, 1998
Priority date
Expiry dateJul 25, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D89/601

Abstract

A semiconductor substrate is partitioned into a main IGBT region and a protection circuit region by a p-type well portion which is formed therebetween in contact with an emitter electrode and which acts as a cut-off region. Both a detection IGBT and protection circuit elements are formed within the protection circuit region. Since excessive carriers flowing from the main IGBT into the protection circuit region can efficiently be extracted through the p-type well portion, a highly reliable and high precision protection circuit built-in insulated gate semiconductor device is realized that can precisely detect any overcurrent, and operate without causing malfunction in the protection circuit and time delay.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.