Method and apparatus for determining a profile of an image displaced a distance from a platen
US5726775A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 26, 1996 |
| Grant date | Mar 10, 1998 |
| Priority date | — |
| Expiry date | Jun 26, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2201/0434
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A profile detector in a scanning system measures spacing of an original non-planar image from a reference image plane of the scanning system. The spacing is measured by projecting a spot of light, with a collimated light source, onto a scan line of the original non-planar image at an angle that is oblique with respect to the fast scan direction of the scanning system. A first photosensor converts optical information reflecting off of the original non-planar image at a first slow scan position into electrical profile data. A position along the fast scan direction is identified for the first slow scan position by locating the spot of light in the electrical profile data. The located position is compared with a pre-recorded position along the fast scan direction for the first slow scan position. The pre-recorded position defines a position where the first photosensor would have detected the spot of light if it reflected off of a planar image. The difference between the located position and the pre-recorded position is used to determine the value for the spacing between the original non-planar image and the reference image plane at the first slow scan position. In a one pass scanning s…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.