Inventor · Houston, TX, US

John Walsh

15Patents
6h-index
10Co-inventors
63Inventor score

Filing activity: Sep 28, 1995 → Aug 15, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US6348981B1 Scanning system and method for stitching overlapped image data Electricity 41 Expired
US6540315B1 Systems and methods for stitching overlapping swaths Physics 22 Expired
US5726775A Method and apparatus for determining a profile of an image displaced a distance from a platen Electricity 19 Expired
US6181441A Scanning system and method for stitching overlapped image data by varying stitch location Electricity 12 Expired
US7310285B2 Method for characterizing shear wave formation anisotropy Physics 10 Expired
US5604608A Device and method for controlling the scan speed of an image input terminal to match the throughput constraints of an image processing module Electricity 8 Expired
US5687009A Device and method for maintaining image scanner data output rate without regard to scanline length while maintaining a constant integration time Electricity 3 Expired
US10846482B2 Multi-word phrase based analysis of electronic documents Physics 2 Active
US9213122B2 Single well anisotropy inversion using velocity measurements Physics 2 Active
US12079254B2 Multi-word phrase based analysis of electronic documents Physics 0 Active
US10445430B2 Multi-word phrase based analysis of electronic documents Physics 0 Active
US9581716B2 Methods and apparatus for estimating borehole mud slownesses Physics 0 Active
US10436921B2 Multi-well anisotropy inversion Physics 0 Active
US11748388B2 Multi-word phrase based analysis of electronic documents Physics 0 Active
US12271446B1 Using machine learning and free text data to detect and report events associated with use of software applications Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.