Process for dynamic composition and test cycles reduction
US5726996A · kind A · utility
21Cited by
4References
3Claims
0Family size
Assignee
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Key dates
| Filing date | Sep 18, 1995 |
| Grant date | Mar 10, 1998 |
| Priority date | — |
| Expiry date | Sep 18, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318392
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A new dynamic process for test sequence compaction and test cycle reduction that identifies bottlenecks that prevent vector compaction and test cycle reduction for test sequences generated initially and generates subsequent test sequences with the aim of eliminating bottlenecks of the initially generated test sequences. To apply the process to sequential circuits, a sliding anchor frame technique is used that involves specifying the unspecified bits of a partially specified test sequence to detect other faults.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.