Patent · US Expired

Programmable array interconnect latch

US5732246A · kind A · utility

179Cited by
28References
31Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 7, 1995
Grant dateMar 24, 1998
Priority date
Expiry dateJun 7, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K19/17748
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A given interconnect of a programmable gate array includes a programmable repeater circuit that enables selective isolation and testing of a select block of configured circuitry within the programmable gate array. The programmable repeater circuit includes an input node coupled to a first portion of the given interconnect and an output node coupled to a second portion of the given interconnect. A selective buffer circuit selectively outputs a buffered output signal to the output node that is related to a logic state at the input node. A signal storage circuit is also connected to the input node for selectively storing the logic state received from the input node. In a further embodiment, the signal storage circuit comprises an LSSD register. A primary latch of the LSSD register receives data selectively either from the input node, in accordance with a first clock signal, or alternatively from a secondary serial input node, in accordance with a second clock signal. A secondary latch of the LSSD register is selectively coupled, per a third clock signal, to receive and latch therein latched data of the primary latch. Data representative of data latched within the secondary latch is pr…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.