Inventor · Jericho, VT, US

Brian Worth

23Patents
11h-index
33Co-inventors
75Inventor score

Filing activity: Jun 2, 1995 → Jun 27, 2018

Most-cited inventions

PatentTitleAreaCited byStatus
US5745734A Method and system for programming a gate array using a compressed configuration bit stream Electricity 233 Expired
US5732246A Programmable array interconnect latch Electricity 179 Expired
US5692147A Memory mapping method and apparatus to fold sparsely populated structures into densely populated memory columns or rows by selectively transposing X and Y address portions, and programmable gate array applications thereof Electricity 165 Expired
US5867507A Testable programmable gate array and associated LSSD/deterministic test methodology Physics 92 Expired
US5671432A Programmable array I/O-routing resource Electricity 90 Expired
US5652529A Programmable array clock/reset resource Electricity 76 Expired
US6021513A Testable programmable gate array and associated LSSD/deterministic test methodology Physics 43 Expired
US5646546A Programmable logic cell having configurable gates and multiplexers Electricity 38 Expired
US6379828B1 Fuel cell Emerging Cross-Sectional Technologies 33 Expired
US9104834B2 Systems and methods for single cell product path delay analysis Physics 20 Active
US5781032A Programmable inverter circuit used in a programmable logic cell Electricity 19 Expired
US5748009A Programmable logic cell Electricity 10 Expired
US6198400A Portable gas detection and/or monitoring apparatus for a hostile environment Physics 10 Expired
US5703498A Programmable array clock/reset resource Electricity 9 Expired
US10557838B2 Portable gas detecting and monitoring apparatus Physics 5 Active
USD432037S Gas detection unit General 4 Expired
US5717346A Low skew multiplexer network and programmable array clock/reset application thereof Electricity 3 Expired
US10782274B2 Portable long term gas detecting and monitoring apparatus Physics 2 Active
US9104832B1 Identifying and mitigating electromigration failures in signal nets of an integrated circuit chip design Physics 2 Active
US10656040B2 Harsh environment differential pressure monitor Physics 1 Active
US10816522B2 Continuous gas detection and monitoring apparatus for harsh environments Physics 0 Active
US8904329B2 Systems and methods for single cell product path delay analysis Physics 0 Active
US7089132B2 Method and system for providing quality control on wafers running on a manufacturing line Electricity 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.