System for detecting faults in connections between integrated circuits and circuit board traces
US5736862A · kind A · utility
18Cited by
7References
11Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 22, 1995 |
| Grant date | Apr 7, 1998 |
| Priority date | — |
| Expiry date | Jun 22, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2853
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for detecting open circuits in connections between pins of an integrated circuit (IC) and traces on a circuit board on which the IC is mounted makes use of a-c paths inherent in the IC. An input signal is applied to a trace to which a pin of the IC is nominally connected. An internal a-c path in the IC carries the signal to another pin. Failure to detect an output signal derived from the input signal, above predetermined thresholds, at the trace to which the latter pin is nominally connected indicates failure of a pin-to-trace connection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.