Patent · US Expired

Apparatus and method for actively controlling the DC potential of a cathode pedestal

US5737177A · kind A · utility

62Cited by
3References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 17, 1996
Grant dateApr 7, 1998
Priority date
Expiry dateOct 17, 2016

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T279/23
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus for actively controlling the DC cathode potential of a wafer support pedestal within a semiconductor wafer processing system. The apparatus contains a variable DC power supply coupled through an RF filter to a cathode pedestal. The variable DC power supply is actively controlled by a control signal generated by a cathode bias control unit, e.g., a computer or other control circuitry. The cathode bias control unit can be as simple as an operator adjustable control signal, e.g., a rheostat. However, for more accurate control of the DC power supply, a feedback circuit is used that generates a control signal that is proportional to the peak-to-peak voltage on a cathode pedestal. The application of the DC bias to the pedestal reduces the DC potential difference between the wafer and the cathode and, thereby avoids arcing from the wafer to the pedestal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.