Patent · US Expired

Redundant memory cell selecting circuit having fuses coupled to memory cell group address and memory cell block address

US5740114A · kind A · utility

8Cited by
2References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 10, 1995
Grant dateApr 14, 1998
Priority date
Expiry dateMay 10, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/844
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An apparatus for selecting redundant memory cells in integrated circuit memory devices. The apparatus includes eight memory cell blocks, each of which includes a plurality of memory cell groups, a redundant memory cell group of a first set and a redundant memory cell group of a second set; and eight selecting fuse circuit blocks. Four of the selecting fuse circuit blocks are coupled to the memory cell blocks and adapted to select a redundant word line group of the first set of any of the eight memory cell blocks, and the other four selecting fuse circuit blocks are coupled to the memory cell blocks and adapted to select a redundant word line group of the second set of any of the eight memory cell blocks.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.