Patent · US Expired

Compact semiconductor device having excellent electrical characteristics and long time reliability

US5751067A · kind A · utility

5Cited by
12References
2Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 7, 1995
Grant dateMay 12, 1998
Priority date
Expiry dateJun 7, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a semiconductor device which includes a semiconductor substrate, a first insulator layer on the substrate, a conductor pattern formed by a conductive material and arranged on the first insulator layer, the conductor pattern is overlaid by a reacted conductor layer reacted with the conductive material. The conductor pattern is protected by the reacted conductor layer from corrosion. Preferably, a second insulator layer is covered on the reacted conductor layer and is fixedly adhered to the conductor pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.