Method and apparatus for testing emissive cathodes
US5751262A · kind A · utility
9Cited by
14References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 15, 1997 |
| Grant date | May 12, 1998 |
| Priority date | — |
| Expiry date | Aug 15, 2017 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S345/904
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of electrically testing pixel functionality is provided comprising releasably disposing a wafer in a socket. The wafer has at least one baseplate comprised of cathode emitters arranged in pixels. The socket has pads. The socket pads are contacted with test pins, and each of the pixels is addressed individually, thereby causing the cathode emitters to emit electrons in a current. The current is collected from each of the pixels on an anode screen. Alternatively, the anode card may have pins, and these pins contact pads on the baseplate. The baseplate, or substrate with baseplates, does not require a socket with pins.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.