Patent · US Expired

Pattern generator cicuit for semiconductor test systerm

US5751738A · kind A · utility

3Cited by
2References
5Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 8, 1996
Grant dateMay 12, 1998
Priority date
Expiry dateJul 8, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31813
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A pattern generator that makes it possible to use various option pattern generators (PGs) without changing hardware is realized. To accomplish this, an option circuit includes an option PG initial clock control section that generates an initial clock signal in synchronism with a clock signal to initialize the option PGs; a plurality of option PGs selectively receive one of a plurality of clock output signals of a clock output control section and generate pattern and clock signals; and in a multiplexer which selects one of output signals from the plurality of PGs through an instruction from a select register 24, and a FIFO section which receives a signal from the multiplexer as write data and a write clock, and an output signal of a read clock control section as a read clock, and outputs a signal to a logic circuit as the option PG output signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.