Touch probe with reseat position system
US5756886A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 25, 1996 |
| Grant date | May 26, 1998 |
| Priority date | — |
| Expiry date | Sep 25, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/016
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A touch probe which includes a fixed member, a movable member, a stylus, a bias means, and a reseat position system which permits the fixed member and the movable member to make contact with each other at pairs of contact points at positions which are spaced from one another. In the reseat position system, piezoelectric elements are provided which cause the fixed member and the movable member to move relatively in directions constrained by said pairs of contact points after a force applied to the movable member is removed. This realizes a touch probe which can secure high position reproducibility for a long period of time even if frictional forces act between the fixed member and the movable member.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.