Output driver circuit for suppressing noise generation and integrated circuit device for burn-in test
US5757228A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 31, 1997 |
| Grant date | May 26, 1998 |
| Priority date | — |
| Expiry date | Jan 31, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C11/401
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
An improved output driver circuit for a semiconductor integrated circuit device is provided. The output driver circuit receives a type select signal (.phi.1, /.phi.1) determined by bonding selection. When a heavy load circuit is connected to an output terminal (DQ), a signal (.phi.1) of low level and a signal (/.phi.1) of high level are provided, whereby transistors (18, 19) are turned on simultaneously in response to a data signal (Mo). When a light load circuit is connected to the terminal (DQ), a signal (.phi.1) of high level and a signal (/.phi.1) of low level are provided, whereby transistors (18, 19) are turned on at a different timing. More specifically, following charging of a light load by a transistor (18) having low mutual conductance, a transistor (19) is turned on. Therefore, noise generation can be flexibly suppressed by bonding selection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.