Hideyuki Ozaki
18Patents
12h-index
11Co-inventors
71Inventor score
Filing activity: May 7, 1981 → Jan 31, 1997
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5319589A | Dynamic content addressable memory device and a method of operating thereof | Physics | 111 | Expired |
| US4575825A | Semiconductor memory device | Physics | 61 | Expired |
| US4586167A | Semiconductor memory device | Physics | 49 | Expired |
| US4833650A | Semiconductor memory device including programmable mode selection circuitry | Physics | 32 | Expired |
| US4808844A | Semiconductor device | Electricity | 28 | Expired |
| US5875132A | Semiconductor memory device for storing data comprising of plural bits and method for operating the same | Physics | 27 | Expired |
| US4455628A | Substrate bias generating circuit | Physics | 25 | Expired |
| US4593382A | MOS dynamic memory device | Physics | 17 | Expired |
| US5621348A | Output driver circuit for suppressing noise generation and integrated circuit device for burn-in test | Physics | 15 | Expired |
| US5757228A | Output driver circuit for suppressing noise generation and integrated circuit device for burn-in test | Physics | 15 | Expired |
| US4789966A | Semiconductor memory device with page and nibble modes | Physics | 12 | Expired |
| US4456939A | Input protective circuit for semiconductor device | Electricity | 12 | Expired |
| US5796287A | Output driver circuit for suppressing noise generation and integrated circuit device for burn-in test | Physics | 11 | Expired |
| US4658379A | Semiconductor memory device with a laser programmable redundancy circuit | Physics | 11 | Expired |
| US4641286A | Auxiliary decoder for semiconductor memory device | Physics | 8 | Expired |
| US4551741A | Dram with polysi bit lines and added junction capacitance | Electricity | 4 | Expired |
| US4835743A | Semiconductor memory device performing multi-bit Serial operation | Physics | 2 | Expired |
| USRE35141E | Substrate bias generating circuit | General | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.