Patent · US Expired

Semiconductor device suitable for testing

US5767527A · kind A · utility

22Cited by
1References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 5, 1995
Grant dateJun 16, 1998
Priority date
Expiry dateJul 5, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/181
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device includes a rigid member embedded in a resin package body for supporting thereon outer leads that extend from the resin package body and test pads provided on the outer leads for testing the semiconductor device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.