Burn-in activity monitor
US5771267A · kind A · utility
2Cited by
3References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 8, 1996 |
| Grant date | Jun 23, 1998 |
| Priority date | — |
| Expiry date | Oct 8, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/88
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
According to the present invention, the invention relates to a semiconductor device having an activity monitor circuit formed thereon for monitoring the switching activity of signals generated by other circuits on the device during burn-in testing. In one embodiment, the activity monitor circuit includes means for detecting a present state of a signal; means for comparing the present state with a previous state of the signal; means for determining whether the state of the signal has switched a requisite number of times in a predetermined time period; and means for displaying the results of the determination.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.