Patent · US Expired

Field of the invention

US5773849A · kind A · utility

11Cited by
9References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 24, 1996
Grant dateJun 30, 1998
Priority date
Expiry dateApr 24, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/0297

Abstract

A field controlled semiconductor device of SiC has a drain, a highly doped substrate layer on top of the drain and a low doped n-type drift layer on top of the substrate layer. A p-type base layer is located on the drift layer and a vertical trench extends through the base layer. In the trench an n-type channel region extends vertically along a wall of the trench and connects a source region layer to the drift layer. A gate electrode is arranged in the trench to be on the opposite side of the channel region with respect to the base layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.