Patent · US Expired

Accelerometers using silicon on insulator technology

US5780885A · kind A · utility

30Cited by
4References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 15, 1996
Grant dateJul 14, 1998
Priority date
Expiry dateAug 15, 2016

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S73/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Process for the production of accelerometers using the silicon on insulator method. The process comprises the following stages: a) producing a conductive monocrystalline silicon film on a silicon substrate and separated from the latter by an insulating layer; b) etching the silicon film and the insulating layer up to the substrate in order to fix the shape of the mobile elements and the measuring device; c) producing electric contacts for the measuring devices; d) partial elimination of the insulating layer in order to free the mobile elements, the remainder of the insulating layer rendering integral the substrate and the moving elements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.