PMOS non-volatile latch for storage of redundancy addresses
US5781471A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 15, 1997 |
| Grant date | Jul 14, 1998 |
| Priority date | — |
| Expiry date | Aug 15, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/0441
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A non-volatile memory latch device includes two PMOS memory cells and a cross-coupled static latch having two PMOS transistors and two NMOS transistors. The floating gates of each PMOS memory cell/transistor pair are coupled together. The control gates of all four PMOS devices are commonly connected to an input. The latch is programmed by applying -3 to -8 volts to the drain of one of the PMOS memory cells, floating the drain of the other PMOS memory cell, and applying 7 to 11 volts to the control gates of all four PMOS devices. The latch is erased by applying 3 to 8 volts to both drains of the PMOS memory cells and -7 to -11 volts to the control gates of all four PMOS devices. Lower programming and erasing voltages are possible with the PMOS latch, as compared with conventional NMOS latches.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.