Patent · US Expired

Self-aligned contact wiring process for SI devices

US5792703A · kind A · utility

63Cited by
12References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 20, 1996
Grant dateAug 11, 1998
Priority date
Expiry dateMar 20, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76897
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of making electrical contacts to device regions in a substrate is taught. A first set of contacts are self-aligning and borderless and a second set of contacts are bordered. The method comprises the steps of providing a first insulating layer over the substrate and forming the first set of contacts in a self-aligned and borderless manner. This is followed by forming a second insulating layer over said first insulating layer, in which the second set of contacts that are bordered to the gate electrode and peripheral diffusions are formed through the first and second insulating layers. In addition, bordered contacts to the first set of borderless contacts are formed through the second insulating layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.