Method and apparatus for combined glide and defect analysis
US5792947A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 18, 1996 |
| Grant date | Aug 11, 1998 |
| Priority date | — |
| Expiry date | Apr 18, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/1207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for detecting defects on the surface of a data recording medium. In one embodiment the present invention includes a sensor for detecting defects on the surface of a magnetic disk. The sensor generates an analog voltage signal that is representative of a surface anomaly detected on the disk surface. An analog signal processor processes the signal before it is received by a peak detecting circuit. The peak detecting circuit detects and converts a peak of the analog signal into digital data. The digital data is received and manipulated by a digital signal processor where the peak amplitude, average peak amplitude and average peak power of the defect may be calculated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.