Phase Metrics, Inc.
🏢 View company profile →55Patents
0Active
55Granted
36Portfolio score
Filing activity: Oct 23, 1991 → Jun 21, 1999
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5517111A | Automatic testing system for magnetoresistive heads | Physics | 65 | Expired |
| US5668470A | Automatic testing system for magnetoresistive heads | Physics | 60 | Expired |
| US5875029A | Apparatus and method for surface inspection by specular interferometric and diffuse light detection | Physics | 58 | Expired |
| US5777740A | Combined interferometer/polarimeter | Physics | 55 | Expired |
| US5793480A | Combined interferometer/ellipsometer for measuring small spacings | Physics | 50 | Expired |
| US5280340A | Method and apparatus to calibrate intensity and determine fringe order for interferometric measurement of small spacings | Physics | 44 | Expired |
| US5883714A | Method and apparatus for detecting defects on a disk using interferometric analysis on reflected light | Physics | 40 | Expired |
| US5818592A | Non-contact optical glide tester | Physics | 36 | Expired |
| US6088092A | Glass substrate inspection apparatus | Physics | 33 | Expired |
| US5903085A | Piezoelectric nanopositioner | Electricity | 27 | Expired |
| US5771130A | Method and apparatus for non-contact servo writing | Physics | 26 | Expired |
| US5781649A | Surface inspection of a disk by diffraction pattern sampling | Physics | 26 | Expired |
| US5696445A | Method and apparatus for testing the resistive properties of magneto resistive materials using a time variable magnetic field | Physics | 25 | Expired |
| US5661559A | Optical surface detection for magnetic disks | Physics | 23 | Expired |
| US5786677A | Stops and a clutch for a loader that test the flying height of a disk drive head gimbal assembly | Physics | 22 | Expired |
| US5719840A | Optical sensor with an elliptical illumination spot | Physics | 21 | Expired |
| US6140661A | Loader with a matching finger that loads a head gimbal assembly onto a disk | Physics | 21 | Expired |
| US5792947A | Method and apparatus for combined glide and defect analysis | Physics | 20 | Expired |
| US5457534A | Method and apparatus to calibrate intensity and determine fringe order for interferometric measurement of small spacings | Physics | 20 | Expired |
| US5658191A | Burnish head for magnetic media | Performing Operations; Transporting | 19 | Expired |
| US5706080A | Single test station that can test a flying height and electrical characteristics of a recording head | Physics | 19 | Expired |
| US5486924A | Method and apparatus for measurement of roughness and hardness of a surface | Physics | 18 | Expired |
| US5986451A | Low z-height loader for a head gimbal assembly | Physics | 18 | Expired |
| US5841318A | Low noise preamplifier for a magneto-resistive head tester | Physics | 17 | Expired |
| US5696653A | Tooling for holding a head gimbal assembly | Physics | 16 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.