Patent · US Expired

MOS-technology power device integrated structure and manufacturing process thereof

US5798554A · kind A · utility

110Cited by
34References
61Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 22, 1996
Grant dateAug 25, 1998
Priority date
Expiry dateFeb 22, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/516
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A MOS-technology power device integrated structure includes a first plurality of elongated doped semiconductor stripes of a first conductivity type formed in a semiconductor layer of a second conductivity type, each including an elongated source region of the first conductivity type, an annular doped semiconductor region of the first conductivity type formed in the semiconductor layer and surrounding and merged with the elongated stripes, insulated gate stripes extending over the semiconductor layer between adjacent elongated stripes, a plurality of conductive gate fingers extending over and electrically connected to the insulated gate stripes, and a plurality of source metal fingers, each one extending over a respective elongated stripe and contacting the elongated stripe and the respective elongated source region, so that the source metal fingers and the conductive gate fingers are interdigitated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.