Patent · US Expired

Probe system

US5798651A · kind A · utility

14Cited by
4References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 7, 1996
Grant dateAug 25, 1998
Priority date
Expiry dateJun 7, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2887
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A probe system according to the present invention has a plurality of exploration portions disposed in a line, spaced apart from one another for predetermined distances and each having a test head, for establishing electrical connection between the test head and electrodes of a subject of exploration so as to explore electrical characteristics of the subject of exploration, a conveyance passage running parallel to the line of the exploration portions, a retainer portion on which a plurality of the subjects of exploration are placed, which is facing to the conveyance passage and which is capable of elevating vertical with respect to the conveyance passage at a position above the conveyance passage, and delivery and acceptance unit arranged capable of moving along the conveyance passage and arranged to deliver and accept the subjects of exploration between the retainer portion and each of the exploration portions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.