Spring probe and method for biasing
US5801544A · kind A · utility
20Cited by
7References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 16, 1997 |
| Grant date | Sep 1, 1998 |
| Priority date | — |
| Expiry date | Jan 16, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06722
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spring-loaded contact probe for performing tests on an electrical device. The probe includes an elongated plunger having an end with a convex surface retained within a barrel. A spring for applying an axial load is positioned within the barrel and a ball sized to translate a portion of the axial force into a side loading force is positioned between the spring and the convex surface of the plunger. The spring has a tightly wound coil adjacent the ball for maintaining the ball against the barrel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.