Patent · US Expired

Method of forming an interband lateral resonant tunneling transistor

US5804475A · kind A · utility

65Cited by
20References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 19, 1996
Grant dateSep 8, 1998
Priority date
Expiry dateJun 19, 2016

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/936
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

This invention describes a nanometer scale interband lateral resonant tunneling transistor, and the method for producing the same, with lateral geometry, good fanout properties and suitable for incorporation into large-scale integrated circuits. The transistor is of a single gate design and operation is based on resonant tunneling processes in narrow-gap nanostructures which are highly responsive to quantum phenomena. Such quantum-effect devices can have very high density, operate at much higher temperatures and are capable of driving other devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.