Electronic component test apparatus with rotational probe
US5804984A · kind A · utility
12Cited by
17References
32Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 2, 1996 |
| Grant date | Sep 8, 1998 |
| Priority date | — |
| Expiry date | Aug 2, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07392
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test apparatus including at least one probe member precisely aligned using two spaced apart means (e.g., thin dielectric layers having copper thereon) such that the probe can effectively engage a conductor (e.g., solder ball) on an electronic module (e.g., ball grid array package). A compressible member (e.g., elastomeric body) is used to bias the probe toward the conductor. Various probe cross-sectional configurations are also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.