Patent · US Expired

Product resulting from selective deposition of polysilicon over single crystal silicon substrate

US5818100A · kind A · utility

29Cited by
2References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 25, 1997
Grant dateOct 6, 1998
Priority date
Expiry dateMar 25, 2017

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/923

Abstract

A method, and resulting product, are disclosed for selectively forming polycrystalline silicon over exposed portions of a single crystal silicon substrate. The method includes inhibiting the formation of such polycrystalline silicon over adjacent silicon oxide surfaces; and the resulting product of such a process. The polycrystalline silicon is selectively deposited over the single crystal silicon substrate by first forming a thin layer of a lattice mismatched material over the single crystal silicon surface, and then depositing a layer of polycrystalline silicon over the lattice mismatched material. Preferably, the thin lattice mismatched layer comprises a silicon/germanium (SiGe) alloy.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.