Product resulting from selective deposition of polysilicon over single crystal silicon substrate
US5818100A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 1997 |
| Grant date | Oct 6, 1998 |
| Priority date | — |
| Expiry date | Mar 25, 2017 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S438/923
Abstract
A method, and resulting product, are disclosed for selectively forming polycrystalline silicon over exposed portions of a single crystal silicon substrate. The method includes inhibiting the formation of such polycrystalline silicon over adjacent silicon oxide surfaces; and the resulting product of such a process. The polycrystalline silicon is selectively deposited over the single crystal silicon substrate by first forming a thin layer of a lattice mismatched material over the single crystal silicon surface, and then depositing a layer of polycrystalline silicon over the lattice mismatched material. Preferably, the thin lattice mismatched layer comprises a silicon/germanium (SiGe) alloy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.