Patent · US Expired

Non-contact optical glide tester

US5818592A · kind A · utility

36Cited by

2References

29Claims

0Family size

Assignee

Phase Metrics, Inc. · US

Inventors

Kenneth H. Womack · San Diego, US
L. Allan Butler · Carlsbad, US
Michael H. Wahl · San Diego, US

Key dates

Filing date	Feb 7, 1997
Grant date	Oct 6, 1998
Priority date	—
Expiry date	Feb 7, 2017

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/88
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A non-contact optical method and apparatus for use in inspecting and measuring defects on a disk. The apparatus generates an interference pattern from a reference beam reflected from a surface of a transparent slider with a second beam reflected from a surface of a test disk. The resulting interference pattern is processed by a set of photodetectors and processing electronics to quantify and map the location and magnitude of asperities on the disk.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.